Efficient Parameter Extraction and Statistical Analysis for a 0.25 micron low power CMOS Process
نویسنده
چکیده
An efficient parameter extraction strategy suitable for deep submicron CMOS processes is presented. This has been applied to generate a statistical parameter database for a 0.25 micron process and to generate best and worst case models for circuit simulation by means of Principal Component Analysis.
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تاریخ انتشار 1997